电子系统故障预测方法综述  

Review on Fault Prognostic Methods for Electronic Systems

作　　者：刘琦[1] 李耀芳[1] 彭慧卿[1] 崔军[2] 刘宏伟[2] LIU Qi;LI Yaofang;PENG Huiqing;CUI Jun;LIU Hongwei(Computing Center,TCU,Tianjin 300384,China;Institute of Electronic and Information Engineering,Tianjin Polytechnic University,Tianjin 300380,China)

机构地区：[1]天津城建大学计算中心,天津300384 [2]天津工业大学电子与信息工程学院,天津300380

出　　处：《天津城建大学学报》2016年第4期298-301,306,共5页Journal of Tianjin Chengjian University

基　　金：天津城建大学教育教学改革研究项目(JG-1414);天津市教委科研计划项目(20140718;20140805)

摘　　要：利用电子系统的可测性分析方法,从电子系统的故障模式与机理着手,构建了基于测试性的电子系统故障预测方法的框架.综述了国内外故障预测方法的研究现状并进行分类与总结,从基于模型和基于数据驱动2个方面论述了电子系统故障预测方法.最后分析了电子系统故障预测技术存在的问题和难点,展望了该领域未来的发展趋势.Proceeding with the fault mode and mechanism of electronic systems,this paper constructs a framework based on testable fault prognostic methods for electronic systems by the testable analysis method of electronic systems.And then the paper reviews,classifies and summarizes the present research status of fault prognostic methods for electronic systems at home and abroad,and expounds the fault prognostic methods for electronic systems from the model-based and datadriven aspects.Finally,the paper analyzes the problems and difficulties of fault prognostic technologies for electronic systems,and predicts the development trend in this field.

关 键 词：电子系统 故障预测 PHM 

分 类 号：TP271.5[自动化与计算机技术—检测技术与自动化装置] TN06[自动化与计算机技术—控制科学与工程]