支持IEEE1149.7标准的边界扫描控制器的设计与研究  

Design and research on boundary scan controller according with IEEE Std 1149.7

作　　者：颜学龙[1,2] 尹亮亮[1,2] 陈寿宏[1,2] YAN Xuelong;YIN Liangliang;CHEN Shouhong(School of Electronic Engineering and Automation,Guilin University of Electronic Technology,Guilin 541004,China;Guangxi Key Laboratory of Automatic Detecting Technology and Instruments,Guilin 541004,China)

机构地区：[1]桂林电子科技大学电子工程与自动化学院,广西桂林541004 [2]广西自动检测技术与仪器重点实验室,广西桂林541004

出　　处：《现代电子技术》2017年第4期147-150,共4页Modern Electronics Technique

基　　金：广西自动检测技术与仪器重点实验室基金项目(YQ15101)

摘　　要：为解决复杂芯片的测试与调试问题,提出支持IEEE 1149.7标准的边界扫描控制器。在对IEEE 1149.7标准和边界扫描测试技术进行深入研究的基础上,利用上位机进行软件编程,通过QuartusⅡ平台进行IP核的开发,成功设计出了支持IEEE 1149.7标准的边界扫描测试控制器。实验结果表明,控制器能够产生符合IEEE 1149.7标准的两线星型信号和四线输出信号。Aiming at the test and debugging problems of complex chips,a boundary scan controller according with IEEES td 1149.7 is proposed. On the basis of deeply studying the IEEE Std 1149.7 and boundary scan test technology,the upper computer is used to perform the software programming and the IP core is developed by means of the Quartus Ⅱ platform to design the boundary scan test controller according with IEEE Std 1149.7. The experimental results show this controller can generate the two-line star signal and four?line output signal according with IEEE Std 1149.7.

关 键 词：IEEE1149.7标准 USB总线 MScan扫描格式 边界扫描控制器 

分 类 号：TN820.2-34[电子电信—信息与通信工程] TN407