电容器常见漏电失效模式分析及应用建议  

Research for common leakage failure modes of capacitors and suggestions for application

作　　者：崔德胜[1] 陈朝杰[1] 彭磊[1] 熊盛阳 高憬楠 CUI Desheng;CHEN Zhaojie;PENG Lei;XIONG Shengyang;GAO Jingnan(Electronic Components Technology Center, CALT, Beijing 100076, China)

机构地区：[1]中国运载火箭技术研究院元器件可靠性中心,北京100076

出　　处：《电子元件与材料》2017年第9期38-42,共5页Electronic Components And Materials

摘　　要：分析了近年来发生的电容器漏电失效典型案例,研究了瓷介电容器和钽电解电容器的漏电失效机理,分析表明金属迁移和介质层缺陷是导致电容器产生漏电流的主要原因。以电容器漏电流产生的理论机理为基础,从选择、检验和使用可靠性角度,提出了一系列电容器选型建议、检验准则和使用要求,以确保电容器在航天等高可靠领域的应用。A typical case of capacitor leakage fault in recent years was analyzed.The failure mechanism of ceramic capacitors and tantalum electrolytic capacitors were studied.The analysis show that the main causes of leakage current are metal migration and the defects in medium layer.Then a series of selection recommendations,inspection standards and application requirements are proposed from the view of selection,inspection and reliability,in order to improve the reliability of application for aerospace application and other high reliable fields.

关 键 词：瓷介电容器 钽电解电容器 漏电 可靠性 选用 航天 

分 类 号：TM53[电气工程—电器]