基于显微视觉的逆反射标志中心定位方法研究  

Research on Location Method of Retroreflective Target Based on Micro-vision

作　　者：李艳[1] 徐永[1] 李鸿儒 甘晓川[1] 瞿剑苏[1] 马晓苏[1] LI Yan;XU Yong;LI Hongru;GAN Xiaochuan;QU Jiansu;MA Xiaosu(Changcheng Institute of Metrology&Measurement,Beijing 100095,China)

机构地区：[1]航空工业北京长城计量测试技术研究所,北京100095

出　　处：《计测技术》2018年第5期48-55,共8页Metrology & Measurement Technology

基　　金：计量技术基础科研项目(JSJL2015205A008)

摘　　要：为解决工业摄影测量系统基准尺校准中的逆反射标志中心精确定位问题,提出了一种基于显微视觉和图像处理的圆形逆反射标志中心定位方案。介绍了中心定位系统的组成及原理,根据逆反射标志的反光特性及其在显微镜下的图像特征,分析了图像预处理、特征提取以及标志中心定位的图像处理方法。对可能影响标志中心定位结果的图像放大倍率、标志图像在视场中的位置、照明等因素进行了试验分析,对规范基准尺校准过程有重要意义。In order to solve the problem of precise positioning of the center of a circular retroreflection mark in the calibration of the reference scale of industrial photogrammetry system,a positioning scheme of the center of a circular retroreflection mark based on microscopic vision and image processing was proposed.The composition and principle of the center positioning system are introduced.According to the reflective characteristics of the retroreflective mark and its image characteristics under the microscope,the image preprocessing,feature extraction and image processing methods of the center positioning of the mark are analyzed.The magnification of the image,the position of the mark image in the field of view,illumination and other factors that may affect the results of the mark center positioning are tested and analyzed.It is of great significance to standardize the calibration process of the reference scale.

关 键 词：显微视觉 逆反射标志 摄影测量 中心定位 图像处理 

分 类 号：TB9[一般工业技术—计量学]