集成电路可靠性评价技术  

Reliability Evaluation Technique of Integrated Circuits

作　　者：高成[1] 张芮 黄姣英[1] Gao Cheng;Zhang Rui;Huang Jiaoying(School of Reliability and Systems Engineering,Beihang University,Beijing 100191,China)

机构地区：[1]北京航空航天大学可靠性与系统工程学院,北京100191

出　　处：《中国集成电路》2018年第12期64-70,共7页China lntegrated Circuit

基　　金：微电子预研;项目编号:31513050304;项目名称:集成电路硬件木马攻防示范研究

摘　　要：基于集成电路技术的发展趋势,从技术发展、应用、鉴定评价三个层面提出集成电路可靠性评价的新需求。针对可靠性筛选、寿命试验和可靠性预计进行传统集成电路可靠性评价技术的适用性分析。针对六种集成电路可靠性评价新方法进行基础理论和国内研究现状分析,包括可靠性预计方法的扩展、基于敏感参数的可靠性评价、基于失效物理的可靠性评价、基于失效物理的可靠性预计、故障预计与健康管理和可靠性强化试验。提出即时定量地对高可靠集成电路进行有效的可靠性评价,需要根据具体需求采取各种先进的可靠性评价方法。强调可靠性是设计出来的,核心永远是设计。Based on the development of integrated circuit,new requirement of reliability evaluation was discussed from technological development,application and evaluation.Applicability analysis of traditional ICs reliability evaluation technique including reliability screening,life test and reliability prediction was carried out.Theory of foundation and domestic research status was analyzed against six new reliability evaluation techniques,including extension of reliability prediction,sensitive parameter method,physics of failure,reliability prediction based on physics of failure,prognostics and health management and high accelerated stress test.It was proposed that various advanced reliability evaluation methods should be adopted according to specific needs for effective reliability evaluation of high reliability ICs.It was emphasized that reliability is designed,and the core is always the design.

关 键 词：集成电路 可靠性评价新需求 传统可靠性评价技术 可靠性评价新技术 

分 类 号：TN407[电子电信—微电子学与固体电子学]