基于电压补偿的晶体管直流增益在线测试系统  

Online Testing System for DC Gain of Transistor Based on Voltage Compensation

作　　者：鲁艺[1] LU Yi(Institute of Nuclear Physics and Chemistry,China Academy ofEngineering Physics,Mianyang 621900,China)

机构地区：[1]中国工程物理研究院核物理与化学研究所,绵阳621900

出　　处：《现代应用物理》2018年第4期81-86,共6页Modern Applied Physics

基　　金：国家自然科学基金面上基金资助项目(11775198)

摘　　要：利用晶体管直流增益随中子辐照注量的变化关系,建立了基于电压补偿的晶体管直流增益在线测试系统,以模块化软件架构设计方法及电压回读技术,实现了不同辐照功率下晶体管直流增益的实时监测,获得了辐照期间晶体管器件敏感参数的变化规律。结果表明,在不同中子注量辐照下,研制的直流增益在线测试系统可满足晶体管损伤效应的实时测量要求,系统的测试精度达0.2%。An online testing system of DC gain of transistor is developed based on the relationship between the DC gain and the neutron fluence,and the real-time monitoring of DC gain of the transistor under different neutron fluence irradiation is realized by using the modular software architecture design method and the voltage read-back technology.The results indicate that the developed online DC gain testing system can meet the requirements of real-time measurement of transistor damage effect under different neutron fluences,and the accuracy of testing system could be as high as 0.2%.

关 键 词：中子辐照 中子注量 电压补偿 双极晶体管 直流增益 

分 类 号：TL81[核科学技术—核技术及应用]