基于面包板的在线逻辑门芯片测试装置设计  

Design of on-line logic gate chip test device based on bread board

作　　者：郑兆兆[1] 高静 ZHENG Zhao-zhao;GAO Jing(College of Electrical Engineering,Yanshan University, Qinhuangdao 066004, China;Laboratory and Asset Management Office, Yanshan University, Qinhuangdao 066004, China)

机构地区：[1]燕山大学电气工程学院,河北秦皇岛066004 [2]燕山大学实验室与资产管理处,河北秦皇岛066004

出　　处：《实验室科学》2019年第1期201-203,206,共4页Laboratory Science

基　　金：燕山大学实验教学改革项目(项目编号:JG2016SY04)

摘　　要：随着数字电路实验教学改革的推进,实验成功率成为衡量实验教学效果的一个重要因素。针对数字电路实验中常用的74系列芯片,设计了一种基于面包板的在线逻辑门芯片测试装置,利用逻辑知识验证芯片功能。这种测试装置直观、形象,便于深化学生对集成芯片功能和理论知识的理解与掌握,激发学生的主观能动性。结合教学实际,提出固定部分芯片的实验模式,减少芯片插拔频率,降低芯片损耗,大大提高了实验成功率和实验教学效果,在数字电路实验教学中具有重要的意义。With the reform of digital circuit experiment teaching, the success rate of experiment has become an important factor to evaluate the effect of experiment teaching. Aiming at the 74 series chips commonly used in digital circuit experiments, an on-line logic gate chip test device based on bread plates is designed, and the chip functions are verified by logical knowledge. This kind of testing device is intuitive and vivid, which is convenient for students to understand and master the function and theoretical knowledge of the integrated chip, and stimulate the subjective initiative of the students. Combining with teaching practice, puts forward the fixed part of the chip experiment mode, reduce the chip plug frequency, reduce the loss of the chip, greatly improving the success rate of experiments and the experimental teaching effect, has important significance in experimental teaching of digital circuit.

关 键 词：数字电路 逻辑门 在线芯片测试 实验教学 

分 类 号：G642.0[文化科学—高等教育学]