连续方波脉冲电压下PCB绝缘可靠性的多变量威布尔失效模型  

Multi-Parameter Weibull Failure Model of PCB Insulation Reliability under Continuous Square Impulse Voltage

作　　者：周湶[1] 熊涛涛 江天炎 文明乾 欧阳希 Zhou Quan;Xiong Taotao;Jiang Tianyan;Wen Mingqian;Ouyang Xi(State Key Laboratory of Power Transmission Equipment & System Security and New Technology Chongqing University,Chongqing 400044 China;School of Electrical and Electronic Engineering Chongqing University of Technology,Chongqing 400054 China)

机构地区：[1]输配电装备及系统安全与新技术国家重点实验室(重庆大学),重庆400044 [2]重庆理工大学电气与电子工程学院,重庆400054

出　　处：《电工技术学报》2019年第6期1310-1318,共9页Transactions of China Electrotechnical Society

基　　金：国家自然科学基金(51507017);"111"引智基地国际合作(B08036)资助项目

摘　　要：印制电路板(PCB)作为航天器供电系统的核心元件,其绝缘可靠性水平直接影响航天器的安全稳定运行。为此,提出一种基于多参数威布尔失效分布的PCB绝缘可靠性模型。首先,采用威布尔分布对电-热双应力作用下PCB的绝缘失效数据进行统计分析,并采用极大似然估计得到电-热双应力作用下PCB的绝缘特征失效时间。其次,分别建立基于指数函数(EF)模型及Fallou模型的PCB绝缘可靠性失效模型。最后,对PCB发生击穿失效的行为与机理进行讨论分析,分析表明温度、电场及两者引起的热量积累能促进PCB失效过程中放电的发生与发展,加速PCB的绝缘劣化,降低其绝缘可靠性。Printed circuit board(PCB)is the core component of the spacecraft power supply system,and its insulation reliability directly affects the safe and stable operation of the spacecraft.For this reason,a reliability model for PCB insulation based on multi-parameter Weibull failure distributions(WFDs)is proposed.Firstly,the WFDs are used to statistically analyze the failure data of PCB under the action of electrical-thermal double stress,and the insulation characteristic failure time of PCB is obtained by the maximum likelihood estimation.Secondly,the PCB insulation reliability failure model is established through combining the exponential function(EF)and Fallou model with the standard WFDs,respectively.Finally,the behavior and mechanism of breakdown failure occurred in PCB are discussed and analyzed.The analysis shows that the occurrence and development of the electric discharge can be promoted by the temperature,electric field and the heat accumulation caused by them during PCB failure process,which accelerates the insulation degradation of PCB and reduces its insulation reliability.

关 键 词：印制电路板 威布尔失效分布 指数函数 Fallou模型 绝缘可靠性 

分 类 号：TM855[电气工程—高电压与绝缘技术]