电流对不同厚度GaN基白光LED可靠性的影响及光电特性研究  

Influence of current on reliability of GaN-based white LED with different thickness and study of photoelectric characteristics

作　　者：曾繁响 刘倩 熊传兵 ZENG Fanxiang;LIU Qian;XIONG Chuanbing(School of Physics and Information Engineering, Minnan Normal University,Zhangzhou Fujian 363000,China)

机构地区：[1]闽南师范大学物理与信息工程学院,福建漳州363000

出　　处：《激光杂志》2019年第3期32-35,共4页Laser Journal

基　　金：国家自然科学基金(No.61307059;No.61405086)

摘　　要：制备不同厚度GaN基白光LED芯片为了研究不同厚度的芯片可靠性以及电流对光电特性的影响,应用了加速老化以及积分球测试的方法,对LED进行了电流应力的老化试验和光电性能测试,分析了光电参数在老化过程中的变化情况。实验结果显示,所有的芯片随着电流的加大LED出光的相关色温上升,红色比减少;随着GaN基白光LED芯片厚度增加,峰值波长发生蓝移现象而且光通量衰减较快,在短期老化后的结果更为明显。通过对光谱曲线的数据处理,从理论上分析了峰值波长、相关色温和光通量随芯片厚度变化的原因。Preparation of different thickness of GaN base to study the different thickness of white LED chip chip reliability and the influence of current on the photoelectric characteristic,application of accelerated aging and the method of integrating sphere test current stress aging test for LED and optical performance test,analysis of the photoelectric parameter changes in the aging process The experimental results showed that all the chips with the current increase LED light correlated color temperature rise,red than reducing;As GaN base white LED chip thickness increases,the peak wavelength blue shift phenomenon and luminous flux decay quickly,in the short term result of aging Through data processing of spectrum curve,peak wavelength moderate correlated color luminous flux are analyzed theoretically the cause of the change with the chip thickness.

关 键 词：GAN基发光二极管 加速老化 积分球测试 光电性能 

分 类 号：TN291[电子电信—物理电子学]