LCR测量仪的研究与设计  

Research and Design of LCR Instrument

作　　者：宋永 杨阔 SONG Yong;YANG Kuo(College of Electronic Infermation and Automation,A ba Teacher sUniversity,Wenchuan 623002,China;Institute of Applied Physics,A ba Teacher s University,Wenchuan 623002,China)

机构地区：[1]阿坝师范学院电子信息与自动化学院,四川汶川623002 [2]阿坝师范学院应用物理研究所,四川汶川623002

出　　处：《仪表技术与传感器》2019年第5期43-45,72,共4页Instrument Technique and Sensor

基　　金：四川省教育厅科研项目(18ZA0004);阿坝师范学院课题:“大学物理”(20170809)

摘　　要：针对传统LCR测试仪存在精度低、响应速度慢以及量程小等缺点,设计了一种基于双MCU的LCR测量系统。系统以ARM和CPLD双MCU为开发平台,利用CPLD+DDS技术产生系统所需的精密信号源,采用矢量电压/电流信号检测电路和相敏检波电路实现矢量信号的精密检测,选用S3C6410微控制器实现数字信号的滤波、转换以及矢量分解。多次测试结果表明,设计的LCR测试仪检测稳定性好,方差小于0.05%,检测精度高,各项性能符合设计指标。Aiming at the shortcomings of traditional LCR tester,such as low precision,slow response and small range,an LCR measurement system based on dual MCU is designed.The system uses ARM and CPLD dual MCU as the development plat form.The CPLD+DDS technology is used to generate the precise signal source required by the system.The vector voltage/current signal detection circuit and the phase sensitive detection circuit were used to realize the precise detection of the vector signal.The S3C6410 microcontroller was selected to realize filtering,conversion and vector decomposition of digital signals.The results of sev eral tests show that the system design of the LCR tester has an accuracy of about 0.05%,and the performance meets the design specifications.

关 键 词：LCR 相敏检波 微控制器 矢量分解 

分 类 号：TP934[自动化与计算机技术]