基于DSP+ARM双核系统的电能质量检测装置设计  被引量:13

Design of power quality detection device based on DSP + ARM dual-core system

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作  者:佟为明[1] 佟春天 陈培友 陶耕宇 金显吉[1] Tong Weiming;Tong Chuntian;Chen Peiyou;Tao Gengyu;Jin Xianji(School of Electrical Engineering and Automation,Harbin Institute of Technology,Harbin 150000,China;The PLA Academy of Military Engineering,Beijing 100089,China)

机构地区:[1]哈尔滨工业大学电气工程及其自动化学院,哈尔滨150000 [2]中国人民解放军军事科学院国防工程研究院,北京100089

出  处:《电测与仪表》2019年第18期99-106,共8页Electrical Measurement & Instrumentation

摘  要:为了满足现有的电能质量扰动监测装置实时、高效等优点,文章基于DSP+ARM双核系统和AD7606芯片设计一款电能质量检测装置。该装置充分发挥DSP+ARM双核的优势,能够实现数据的高速处理。该装置具有集成度高、高性价比等特点,故非常适用于工业产品开发。According to the large amount of calculation of high data volume and high requirement of instantaneity of the power quality detection device,this paper designs a power quality detection device based on DSP+ARM dual-core system and AD7606.The device takes full advantage of DSP+ARM dual-core system and achieves high speed of data accessing,which is featured with high integration and low cost.The device designed is suitable for development of industrial products with high market competitiveness.

关 键 词:电能质量 AD7606 DSP ARM 

分 类 号:TM932[电气工程—电力电子与电力传动]

 

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