温度均匀性对微波介质基板介电常数热系数测试的影响  

Effect of temperature uniformity on testing dielectric constant thermal coefficient of microwave substrate

作　　者：董彦辉[1] 于艺杰 张永华[2] Dong Yanhui;Yu Yijie;Zhang Yonghua

机构地区：[1]中国电子科技集团公司第四十六研究所,天津300220 [2]无锡江南计算技术研究所印制板质量检测中心,江苏无锡210023

出　　处：《印制电路信息》2019年第10期41-45,共5页Printed Circuit Information

摘　　要：文章通过采用多点温控和单点温控测试系统,分别对两种微波介质基板的介电常数热系数进行测试的方式,研究分析了温度均匀性对测试介电常数热系数的影响。测试结果表明,对于介电常数热系数介于-0.002%/℃~0.202%/℃(-20 ppm/℃~20 ppm/℃)的微波介质基板材料,温度均匀性对于介电常数热系数的测试结果准确性影响较大。The dielectric constant thermal coefficients of samples were measured by multi-point temperature control and single point temperature-control dielectric constant thermal coefficient test system.The effect of temperature uniformity on dielectric constant thermal coefficient was studied.For microwave dielectric substrate materials with dielectric constant thermal coefficient between-0.002%/℃~0.202%/℃(-20 ppm/℃and 20 ppm/℃),the temperatureuniformity has a great influence on the accuracy of the dielectric constant thermal coefficient.

关 键 词：微波介质基板 介电常数热系数 温度均匀性 

分 类 号：TN41[电子电信—微电子学与固体电子学]