基于两次采样的大动态微弱信号探测  

Large Dynamic Weak Signal Detection Based on Twice Sampling

作　　者：周传航 罗向东[1] 邵佩旭 ZHOU Chuanhang;LUO Xiangdong;SHAO Peixu(NanTong University Institute of Electronic Information,Nantong Jiangsu 226019,China)

机构地区：[1]南通大学电子信息学院

出　　处：《电子器件》2019年第4期891-897,共7页Chinese Journal of Electron Devices

基　　金：国家自然科学基金项目(61474067)

摘　　要：在大动态微弱信号检测领域,为了提高探测系统的ADC模数转换器(Analog-to-Digital Converter)的精度,以滨松公司的CCD电荷耦合器件(Charge-Coupled Device)传感器芯片S11156,选择16位精度的ADI公司的AD9265芯片与AD9747芯片,使用两次采样的设计原理,搭建硬件电路,通过对微弱信号的放大,实现低精度ADC对信号的检测,仿真结果表明可以实现在不改变ADC位数的情况下,实现高精度的测量,满足特定情况下的探测需要。同时硬件电路调试时与仿真结果相吻合。In the field of large dynamic weak signal detection,in order to improve the accuracy of the ADC,hamamatsu’s CCDS11156 chip,ADI’s 16-bit AD9265 chip and AD9747 chip were selected,and the twice-sampling design method was used to build a circuit.By amplifying the weak signal,the low accaracy of ADC can detect the weak signal.The simulation result shows that it can achieve high precision measurement without changing the precision of ADC,which can meet the detection requriment in certain situations.By debugging the circuit,the result coincides with the simulation result.

关 键 词：微弱信号检测 ADC 两次采样 高精度 

分 类 号：TN79.2[电子电信—电路与系统]