原子力显微镜工作原理演示仪  

Device for demonstrating the working principle of atomic force microscope

作　　者：苏峻[1] 胡建桥 SU Jun;HU Jian-qiao(College of Science,Nanjing Forestry University,Nanjing 210037,China;Nanjing Intrinsic Instrument Co.,Ltd.,Nanjing 210037,China)

机构地区：[1]南京林业大学理学院,江苏南京210037 [2]南京本征仪器有限公司,江苏南京210037

出　　处：《物理实验》2019年第12期31-34,39,共5页Physics Experimentation

基　　金：南京林业大学自制实验教学仪器项目(No.nlzzyq201819)

摘　　要：设计了AFM工作原理演示仪,利用反光弹片模拟AFM的微悬臂,利用振动电机激发弹片振动模拟AFM轻敲模式下的微悬臂振动,利用半导体激光器、反射镜、弹片、光屏等组成的结构模拟AFM的光电检测系统,利用二维电机移动平台模拟AFM压电扫描管的平面扫描运动.分别在接触模式和轻敲模式下扫描样品,结果表明光屏上光点的位置或振幅随样品表面的起伏变化显著,演示了AFM光路放大和扫描成像的原理.A demonstration device of atomic force microscope(AFM)was designed.It applied reflective shrapnel to simulate the AFM micro-cantilever,shrapnel vibration excited by vibration motor to simulate the micro-cantilever vibration in AFM tapping mode,a structure composed of a semiconductor laser,two mirrors,a shrapnel,a light screen etc.to simulate the photoelectric detection system of AFM,and a two-dimensional motor moving platform to simulate planar scanning motion of AFM piezoelectric scanning tube.The sample was scanned in contact mode and tapping mode.The results showed that the position or vibration amplitude of the light spot on the screen changed significantly with the height fluctuation on the sample surface,which demonstrated the principle of AFM optical amplification and AFM scanning imaging.

关 键 词：原子力显微镜 微悬臂 接触模式 轻敲模式 成像 

分 类 号：TH742[机械工程—光学工程]