片式电阻防硫化可靠性技术研究  

Study on Reliability of Chip Resistor in Preventing Sulfuration

作　　者：张世莉[1] 唐万军[1] 肖玲[1] ZHANG Shi-li;TANG Wan-jun;XIAO Ling(The 24th Research Institute of China Electronics Technology Group Corporation,Chongqing 400060)

机构地区：[1]中国电子科技集团公司第二十四研究所

出　　处：《环境技术》2020年第1期46-49,56,共5页Environmental Technology

摘　　要：针对某模块产品中片式电阻出现硫化失效问题,通过对片式电阻硫化的机理研究,结合高可靠非封闭结构产品及使用环境要求,开展了多种质量等级电阻、工艺方案、工艺材料的耐硫化环境试验。通过多组试验的对比,提出了非封闭结构产品中片式电阻防硫化的可靠性技术解决方案。For problem of sulfuration failure of chip resistor in a module product,the mechanism of chip resistor sulfuration was studied,combined with high reliability and non-enclosed structure products and operating environment requirements,the sulfuration experiments of various quality levels,process schemes and process materials were carried out.Through the comparison of several experiments,the reliability technical solution of anti-sulfuration of chip resistance in non-closed structure products is proposed.

关 键 词：片式电阻 硫化 非封闭结构 

分 类 号：TN406[电子电信—微电子学与固体电子学] V438.4[航空宇航科学与技术—航空宇航推进理论与工程]