ABB HiPak 6500 V IGBT特性参数测试研究  

Research of ABB HiPak 6 500 V IGBT Testing Features

作　　者：董妮 王昭 李君伟 DONG Ni;WANG Zhao;Lljunwei(CRRC Yongji Electric Co.,Ltd.Xi'an,710018,CHN)

机构地区：[1]中车永济电机有限公司

出　　处：《固体电子学研究与进展》2019年第6期450-454,共5页Research & Progress of SSE

摘　　要：通过研究应用于轨道交通领域的ABB 6 500 V等级的IGBT器件在不同测试条件下动态特性参数的变化趋势,得到IGBT器件在不同结温、不同集电极电流以及不同栅极驱动测试条件下的动态参数。该测试研究可使系统设计者对IGBT器件在损耗、电压、电流变化等方面有更深入的认识,让器件在实际运行系统的应用更具有针对性,借此提升系统的运行效率。By studying the variation trend of dynamic characteristic parameters of ABB 6 500 V IGBT using in railway field under different test conditions, the dynamic features of IGBT under different junction temperatures, different collector currents and different gate driving conditions were obtained. The test study can help system designer achieve a deeper recognition of the loss classification, voltage and current variations of IGBT devices, and makes device applications more pertinence for actual operating system, thereby to promote the system operation efficiency.

关 键 词：测试 绝缘栅双极型晶体管 动态参数 

分 类 号：TM835[电气工程—高电压与绝缘技术] TN389[电子电信—物理电子学]