高速A/D转换器ADS5400板级验证动态参数测试研究  

Research on Board level Dynamic Parameter Test of High speed A/D Converter ADS5400

作　　者：李锐琦 孙勇[1] 何鑫 Li Ruiqi;Sun Yong;He Xin(The 36th Research Institute of China Electronics Technology Corporation,Jinxing Zhejinag,314000)

机构地区：[1]中国电子科技集团公司第三十六研究所,浙江嘉兴314000

出　　处：《电子测试》2020年第9期34-36,共3页Electronic Test

摘　　要：某型号AD采集板调试故障率较高,经排查均与数字通道中AD器件ADS5400部分关键参数失效有关。本文通过开发板级测试系统,对ADS5400关键性能指标进行检测筛选,剔除了早期失效,显著改善了产品质量。The debugging failure rate of a certain AD acquisition board is high,which is related to the failure of some key parameters of AD device ADS5400 in digital channel.In this paper,the board level test system was developed to detect and screen the key performance indicators of ADS5400,eliminate the early failure,and significantly improve the product quality.

关 键 词：AD采集 失效分析 板级测试 动态参数 

分 类 号：TN792[电子电信—电路与系统]