IP保护方法研究进展  

Research progress on IP protection techniques

作　　者：张伟[1] 冯建华[1,2,3] ZHANG Wei;FENG Jianhua(Institute of Microelectronics,Peking University,Beijing 100871,China;School of Software&Microelectronics,Peking University,Beijing 100871,China;Peking University Information Technology Institute(Tianjin Binhai),Tianjin 300450,China)

机构地区：[1]北京大学微纳电子学系,北京100871 [2]北京大学软件与微电子学院,北京100871 [3]北京大学(天津滨海)新一代信息技术研究院,天津300450

出　　处：《微纳电子与智能制造》2020年第1期95-101,共7页Micro/nano Electronics and Intelligent Manufacturing

基　　金：国家自然科学基金(61672054,61176039)项目资助。

摘　　要：电子器件生产成本的增加和集成电路设计方法的改变已导致微电子工业中的新兴威胁,例如伪造、非法复制、反向工程和盗窃,IP保护已经成为一个重要的研究课题。系统概述了各种主流的IP保护方法,包括加密与许可证机制、数字指纹、数字水印、硬件计量、硬件混淆等,重点介绍了基于约束、附加、模块、功率的数字水印方法的研究进展,也介绍了几种最新的IP保护方法,提出了未来IP保护可能的发展方向。The increasing production costs of electronic devices and changes in the design methods of integrated circuits has led to emerging threats in the microelectronics industry such as counterfeiting,illegal copying,reverse engineering and theft.IP protection has become an important research topic.It systematically summarizes various mainstream IP protection techniques in the paper,including encryption and license mechanisms,digital fingerprints,digital watermarks,hardware metering,hardware obfuscation,etc.,and focuses on the research of constraint,addition,module,and power-based digital watermarking techniques.The progress also introduced several latest IP protection techniques,and proposed the possible development direction of IP protection in the future.

关 键 词：IP核 硬件安全 数字水印 硬件计量 

分 类 号：TN492[电子电信—微电子学与固体电子学]