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作 者:刘宇安[1] LIU Yu-an(Jinggangshan university,college of electronics and information engineering,Jaingxi Ji'an 343009,China)
机构地区:[1]井冈山大学电子与信息工程学院,江西吉安343009
出 处:《新一代信息技术》2019年第24期24-29,共6页New Generation of Information Technology
基 金:江西省教育厅科技项目(项目编号:GJJ160743);井冈山大学博士科研启动基金项目(项目编号:JZB15001)资助的课题。
摘 要:多层陶瓷电容的电子噪声对其损伤和退化很敏感,采用电子噪声对多层陶瓷电容进行可靠性表征,需建立明晰的多层陶瓷电容电子噪声模型。然而,现有模型只考虑了寄生电阻中电子涨落并没有考虑电容介质极化子的涨落,无法合理解释多层陶瓷电容的电子噪声现象。因此,本文根据多层陶瓷电容两种元激发的涨落耗散据微观机理,建立了多层陶瓷电容二维电子噪声模型;采用电子噪声的高阶统计量分析方法,对实测数据进行时-频分析,获得了多层陶瓷电容电子噪声的功率谱密度和双谱图,直观地揭示了器件中电子与极化子两种元激发涨落随温度的动态变化规律,研究了多层结构中两元激发的涨落耗散过程产生的二维电子噪声表征方法。The electronic noise of multilayer ceramic capacitor is very sensitive to damage and degradation.Before use electronic noise to characteristic it’s reliability,establishing a clear electronic noise model of it is needed.However,the existing models consider only the electrons fluctuation in parasitic resistances,but not the polaron fluctuation of capacitor dielectric.So the electronic noise phenomenon of multilayer ceramic capacitors cannot explain reasonably.Therefore,based on the microscopic mechanism of fluctuation and dissipation by two-element excitation in multilayer ceramic capacitors,a two-dimensional electronic noise model of multilayer ceramic capacitors is established.Use the high order statistics method to analysis the time-frequency data of electronic noise.The electronic noise power spectral density and double spectra of multilayer ceramic capacitors are obtained.Intuitively reveals the dynamic change law of the two elementary(electronics and polaron)excitation fluctuation with the temperature in the device.A method for the characterization of two-dimensional electronic noise produced by the fluctuation and dissipation process of two-element excitation in multilayer structures is studied.
分 类 号:TN911.6[电子电信—通信与信息系统]
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