非易失性存储器宇航应用的问题与思考  

Problems and Considerations of Non-Volatile Memory in Aerospace Applications

作　　者：张乔木 张延伟[1] 祝名 王旭[1] 段超 Zhang Qiaomu;Zhang Yanwei;Zhu Ming;Wang Xu;Duan Chao(China Aerospace Components Engineering Center,Beijing 100094,China)

机构地区：[1]中国航天宇航元器件工程中心,北京100094

出　　处：《质量与可靠性》2020年第2期26-30,共5页Quality and Reliability

摘　　要：通过调研国内外非易失性存储器可靠性的研究现状,结合国内宇航应用发生的失效问题,分析研究了3种典型宇航用高可靠非易失性存储器的主要失效模式及相应的失效机理,总结了非易失性存储器宇航应用的主要可靠性问题,分别从研制和应用的角度对后续非易失性存储器的宇航应用提出相应的建议,同时对我国宇航级非易失性存储器的发展进行了思考与展望。Investigating the current research status of non-volatile memory reliability at home and abroad,and analyzing the failure problems of domestic aerospace applications of non-volatile memory,the paper summarizes the main failure modes and failure mechanisms of three typical high reliable non-volatile memories for aerospace,and lists the main reliability issues for non-volatile memory in aerospace applications.At the same time,from the perspective of developments and applications,the suggestions for the aerospace applications of non-volatile memory are put forward,and the development of China's aerospace level non-volatile memory is considered and forecasted.

关 键 词：非易失性存储器 宇航应用 失效模式 

分 类 号：V443[航空宇航科学与技术—飞行器设计]