雪崩光电二极管性能测试系统的研究  

Research of performance test system of avalanche diode

作　　者：尹航 洪占勇 丁传杨 YIN Hang;HONG Zhanyong;DING Chuanyang(Anhui Province Key Laboratory of Aerospace Structural Parts Forming Technology and Equipment,Hefei 230009,China;Institute of Industrial and Equipment Technology,Hefei University of Technology,Hefei 230009,China;QuantumCTek Co.,Ltd.,Hefei 230088,China)

机构地区：[1]安徽省航空结构件成形制造与装备实验室,安徽合肥230009 [2]合肥工业大学工业与装备技术研究院,安徽合肥230009 [3]科大国盾量子技术股份有限公司,安徽合肥230088

出　　处：《量子电子学报》2020年第3期321-327,共7页Chinese Journal of Quantum Electronics

基　　金：安徽省重点实验室资助项目(W2018JSKF0065)。

摘　　要：鉴于当前雪崩光电二极管(APD)测试平台存在设备冗杂、测试效率低等问题,设计了一套以现场可编程门阵列(FPGA)为控制核心,搭配高精度时间数字转换芯片TDC-GPX的APD性能测试系统,可实现APD性能参数的自动化测试。同时设计了一种稳定单光子脉冲信号输出方法,并提出了使用时间数字转换进行光子计数及数据处理、后脉冲参数计算的设计方案。通过实验验证,测试系统集成光源信号半峰全宽为46.6 ps,峰值幅度为304.4 mV,幅值抖动为3.7%,满足APD测试对输入单光子源的要求。该测试系统能够有效测试APD性能参数,测试效率得到了极大提升。In view of the fact that current avalanche photodiode(APD)test platforms have the disadvantages of redundant equipment and low test efficiency,an APD performance test system with field programmable gate array(FPGA)as the control core and TDC-GPX as the high-precision time-to-digital conversion chip is designed,which can realize the automatic test of APD performance parameters.In this work,a design method of stable single photon pulse signal output is designed,and the design scheme of photon counting,data processing and post-pulse parameter calculation using time-to-digital conversion is introduced.The experimental results show that the integrated light source of the test system has a full width at half maximum(FWHM)of 46.6 ps,a peak amplitude of 304.4 mV,and an amplitude jitter of 3.7%,which meets the requirements of the APD test for the input single photon source.It indicates that the test system can effectively test the APD performance parameters,and the test efficiency has been greatly improved.

关 键 词：光电子学 性能测试系统 时间数字转换器 光子计数 单光子源 雪崩光电二极管 

分 类 号：TN36[电子电信—物理电子学]