一种基于抗辐照体系架构的单粒子效应等效评估拟合算法  

An Equivalent Evaluation Fitting Method for Single Event Effect Based on Anti-irradiation Architecture

作　　者：高翔[1] 赖晓玲[1] 贺勇鹏 王轩[1] 周国昌[1] GAO Xiang;LAI Xiaoling;HE Yongpeng;WANG Xuan;ZHOU Guochang(China Academy of Space Technology(Xi’an),Xi’an 710100,China)

机构地区：[1]中国空间技术研究院西安分院,西安710100

出　　处：《同位素》2020年第3期142-147,共6页Journal of Isotopes

摘　　要：针对国内加速器辐照实验无法充分满足航天器单粒子抗辐照设计验证需求的问题,本文提出了一种单粒子效应抗辐照等效评估拟合算法模型。该算法模型基于抗辐照体系架构,构建可靠性贡献度耦合因子,获取单粒子效应下系统功能中断截面随粒子线性能量转移(LET)值变化的等效耦合关系,从而降低对辐照实验条件依赖,为航天器抗辐照设计验证提供更多基准数据。最终通过实验数据分析比对,该算法模型可用于辐照实验数据的评估拟合,提升了航天器系统抗辐照设计可靠性评估效率。Aiming at the problem that the domestic accelerator irradiation experiment could not fully meet the verification requirements of single particle anti-irradiation design for spacecraft,an Equivalent Fitting Algorithm for Evaluation of Single Event Effect(EFA-ESEE)was proposed in this paper.Based on the characteristics of anti-irradiation architecture,the reliability contribution coupling factor was constructed to obtain the equivalent coupling relationship between the cross sections of single event function interruption and linear energy transfer(LET)values of heavy ions.Hence,EFA-ESEE could reduce the dependence on irradiation experimental conditions and provide more reference data for spacecraft anti-irradiation design verification.Finally,through the comparison of radiation experiments,the algorithm model could be approximated to the evaluation and fitting of radiation experiment data so as to improve the reliability evaluation efficiency of spacecraft electronic equipment level system.

关 键 词：LET值 翻转截面 单粒子效应 抗辐照体系架构 

分 类 号：TL99[核科学技术—核技术及应用]