一种体外培养神经元原位包埋电镜样品的制作方法  

Preparation of in situ embedding electron microscopic samples of cultured neurons in vitro

作　　者：金良韵 陈欣月 杜尊赎 常丽荣[1] 宋一志[1] 李慧[1] 武艳[1] JIN Liang-yun;CHEN Xin-yue;DU Zun-shu;CHANG Li-rong;SONG Yi-zhi;LI Hui;WU Yan(Department of Human Anatomy and Tissue Embryology,School of Basic Medicine,Capital Medical University,Beijing 100069,China)

机构地区：[1]首都医科大学基础医学院,人体解剖与组织胚胎学系,北京100069

出　　处：《电子显微学报》2020年第3期334-336,共3页Journal of Chinese Electron Microscopy Society

基　　金：国家自然科学基金资助项目(No.81200968).

摘　　要：透射电镜是观察鉴定突触超微结构的重要研究手段。因常规悬浮离心法无法保留细胞原有形貌,难以用于原代培养神经元样品的研究。原位包埋法虽然适用于单层培养细胞样品,但包埋后的剥离,常常会有些难度。本方法探索以细胞基质胶构筑原代培养神经元生长支持界面,原位固定包埋制样。实验结果表明:超薄切片无孔洞及细胞缺失,细胞及突触超微结构保存良好。The transmission electron microscope(TEM)is an important means to observe the ultrastructure of the synapse.Because the conventional suspension centrifugation method can not retain the original morphology of the cells,it is difficult to be used in the study of primary cultured neuron samples.Although the in-situ embedding method is suitable for single-layer culture cell samples,it is often difficult to peel after the embedding.In this method,the growth support interface of primary cultured neurons was constructed by cell Matrixgel,and the samples were fixed and embedded in situ.The results showed that there were no pores and cell deletions in the ultra-thin sections,and the ultrastructure of the cells and synapses was well preserved.

关 键 词：透射电镜技术 原位包埋 原代培养神经元 突触 

分 类 号：Q336[生物学—遗传学]