基于概率统计的物理地址与逻辑地址映射关系提取方法  

A Statistical Method for Extraction of the Mapping Between Physical and Logical Address

作　　者：王勋 张凤祁[1,2] 丁李利 罗尹虹[1,2] 陈伟 郭晓强[1,2] WANG Xun;ZHANG Feng-qi;DING Li-li;LUO Yin-hong;CHEN Wei;GUO Xiao-qiang(Northwest Institute of Nuclear Technology,Xi’an 710024,China;State Key Laboratory of Intense Pulsed Radiation Simulation and Effect,Xi’an 710024,China)

机构地区：[1]西北核技术研究所,西安710024 [2]强脉冲辐射环境模拟与效应国家重点实验室,西安710024

出　　处：《现代应用物理》2020年第2期22-26,共5页Modern Applied Physics

基　　金：国家自然科学基金资助项目(11690043);强脉冲辐射环境模拟与效应国家重点实验室资助项目(SKLIPR1902Z)。

摘　　要：针对从单粒子翻转(SEU)实验数据中提取多单元翻转(MCU)信息时缺少物理地址与逻辑地址映射关系的问题,提出一种基于概率统计的物理地址与逻辑地址映射关系提取方法。通过逐位对比所有包含MCU信息的SEU数据的逻辑地址,统计逻辑地址间不同逻辑位的个数和位置,并分析逻辑位出现的频次,可得到物理地址和逻辑地址之间的映射关系。用重离子试验数据对该方法进行验证,结果表明,该方法能够获取MCU信息提取中最重要的地址映射信息,与逆向工程相比,能在不明显降低MCU提取精度的情况下,节省研究时间和经费。A statistical method is proposed to solve the problem of lacking the relationship between physical address and logical address mapping when extracting multiple cell upsets(MCU)from single event upset(SEU)experimental data.Firstly,exclusive OR(XOR)between the logical addresses of every two SEUs is calculated.Then,the XOR are divided into different groups depending on the number of“1”.Finally,the mapping relationship between the physical and the logical address bits is obtained by analyzing the frequencies of the XOR in each group.The results show that this method can be used to obtain the most important address mapping information in MCU information extraction,and save research time and cost compared with reverse engineering without significantly decreasing the accuracy of MCU extraction.

关 键 词：概率统计 地址映射关系提取 单粒子翻转 多单元翻转 

分 类 号：TN386.1[电子电信—物理电子学]