20 GHz^40 GHz微波介质基板带状线法介电性能测试研究  

Study on 20~40 GHz dielectric properties of microwave dielectric substrates by strip line method

作　　者：刘兆枫[1] 刘国龙 董彦辉[1] Liu Zhaofeng;Liu Guolong;Dong Yanhui(The 46th Research Institute,CETC,Tianjin 300220,China)

机构地区：[1]中国电子科技集团公司第四十六研究所,天津300220

出　　处：《印制电路信息》2020年第6期31-34,共4页Printed Circuit Information

摘　　要：文章对采用20~40 GHz微波介质基板带状线法测试介电常数、介质损耗、介电常数温度系数进行了探究,并将该方法与TE01δ测试腔法和介质谐振器法介电测试结果进行了比较,经研究表明,采用带状线法对于20~40 GHz介电常数结果与TE01δ测试腔法和介质谐振器法一致性较好,由于介电常数温度系数只与介电常数和温度有关系,所以对于20~40 GHz介电常数温度系数也可以采用该方法进行测试。对于介质损耗的测试,采用带状线法测试结果还存在一定的误差,通过提高Q值,优化系统,可能会进一步提高介质损耗测试的准确性。In this paper,the dielectric constant,dielectric loss and temperature coefficient of dielectric constant are measured by 20~40 GHz stripline method.The results are compared with TE01δand dielectric resonator method.The results of the stripline for the dielectric constant of 20~40 GHz have good agreement with the dielectric resonator method.Because the temperature coefficient of dielectric constant is only related to dielectric constant and temperature,the method can also be used for testing the dielectric constant temperature coefficient in the range of 20~40 GHz.There are still some errors in the test for dielectric loss with stripline,so it is possible to improve the dielectric loss accurately by further optimizing the system and increasing the Q value.

关 键 词：20~40 GHz 微波介质基板 介电常数 介质损耗 

分 类 号：TN41[电子电信—微电子学与固体电子学]