提高自动测试设备ATE测试板的设计效率  

Improve the Design Efficiency of ATE Test Board

作　　者：陶雪芬 TAO Xuefen(Giga Force Electronics Co.,Ltd,Shanghai 201203,China)

机构地区：[1]上海季丰电子股份有限公司,上海201203

出　　处：《集成电路应用》2020年第7期42-44,共3页Application of IC

基　　金：上海市科技企业技术创新课题项目。

摘　　要：基于对IC做ATE量产测试是对每一颗IC检测和判断功能是否达到设计要求的重要标准,也是IC从设计到生产再到上市整个过程中的一个重要环节。为了提高设计效率和质量,阐述工程师需要了解ATE测试的基本原理和结构,并运用各种工具,总结贯通,建立定式模板,以达到提高效率与质量的目的。Based on the ate mass production test of IC is an important standard for each IC to detect and judge whether the function meets the design requirements,and also an important link in the whole process of IC from design to production and then to market.In order to improve the efficiency and quality of design,this paper describes that engineers need to understand the basic principle and structure of ATE test,and use various tools to summarize and link up,and establish a fixed template to achieve the purpose of improving efficiency and quality.

关 键 词：集成电路测试 自动测试 定式模板 

分 类 号：TN407[电子电信—微电子学与固体电子学] TN406