Tikhonov正则化法反解计算γ多层屏蔽厚度  

Multi-Shielding Layer Thicknesses by Tikhonov Regularization Method with Gamma-Ray Spectrum

作　　者：陈颖[1] 杨苏[1] 王志慧 张连平[1] 肖洒[1] 何伟波[1] CHEN Ying;YANG Su;WANG Zhi-hui;ZHANG Lian-ping;XIAO Sa;HE Wei-bo(Institute of materials,China Academy of Engineering Physics,Jiangyou Sichuan 621908,China)

机构地区：[1]中国工程物理研究院材料研究所,四川江油621908

出　　处：《核电子学与探测技术》2020年第1期151-155,共5页Nuclear Electronics & Detection Technology

基　　金：国家自然科学基金(11605163);中国工程物理研究院科学技术发展基金(2015B0103014)资助。

摘　　要：基于Tikhonov正则化法,以单层、双层以及三层屏蔽的152Eu点源为例,对γ多层屏蔽材料厚度进行了反解研究.结果表明:Tikhonov正则化法能够给出比最小二乘法更稳定且可靠的计算结果.相对于线性吸收系数的计算与测量值的偏差,γ特征谱线的选取是影响反解结果的主要因素.In present work,Tikhonov regularization method is applied to the inverse analysis of the multi-shielding layer thicknesses by taking the point source 152Eu with single,double and three shielding layers as examples.It is shown that by comparing with the least square m ethod,Tikhonov regularization method can provide much more accurate results.The selection of gamma-ray energy lines is the major factor influencing the inverse result relative to the deviation of absorption coefficient calculation and statistical error of the detection.

关 键 词：Γ能谱 多层屏蔽 TIKHONOV正则化 反解计算 

分 类 号：O571.33[理学—粒子物理与原子核物理]