嵌入式存储器动态故障诊断数据压缩设计  

Design of embedded memory dynamic fault diagnosis data compression

作　　者：陈佳楠 马永涛 李松 刘丰 Chen Jianan;Ma Yongtao;Li Song;Liu Feng(School of Microelectronics,Tianjin University,Tianjin 300072,China;Tianjin Key Laboratory of Imaging and Sensing Microelectronic Technology,Tianjin 300072,China;NXP Semiconductors(Tianjin)Co.,Ltd.Tianjin 300385,China)

机构地区：[1]天津大学微电子学院,天津300072 [2]天津市成像与感知微电子技术重点实验室,天津300072 [3]恩智浦半导体(天津)有限公司,天津300385

出　　处：《电子测量与仪器学报》2020年第7期203-209,共7页Journal of Electronic Measurement and Instrumentation

摘　　要：在微纳米级工艺中,嵌入式存储器出现开路故障的概率增高,从而带来动态故障。当静态故障与动态故障同时存在时,传统的暂停导出内建自测试设计虽然可以将故障诊断数据正确输出,但存在诊断数据冗余的问题。因此,提出一种动态故障诊断数据压缩的内建自测试设计。在不影响诊断数据完好性的前提下,识别故障模式为行故障、列故障与单元故障,并对其诊断数据进行压缩解决诊断数据冗余的问题。仿真结果表明,该设计能够正确压缩动态故障诊断数据,大幅度提高输出效率,减少输出时间,并且面积开销较小。在8 K×16的存储器的面积开销为3.16%,20%行列故障与5%动态故障下诊断数据压缩比为3.96%。In the process of micro and nano scale, the probability of an open circuit fault in the embedded memory increased, which resulting in dynamic faults. When static faults and dynamic faults coexisted, the traditional pause-and-export design of built-in self-test designs could correctly output fault diagnosis data, but there was a problem of diagnostic data redundancy. Therefore, a built-in self-test design for dynamic fault diagnosis data compression was proposed. Under the premise that it was not affecting the integrity of the diagnostic data, the problem of redundancy of diagnostic data was solved by identifying the fault modes as line faults, column faults and unit faults, and compressing the diagnostic data. The simulation results show that the design can correctly compress the dynamic fault diagnosis data, greatly improve the output efficiency, reduce the output time, and the area overhead is small. The area overhead of the 8 K×16 memory is 3.16%, and the diagnosis data compression ratio is 3.96% under 20% row failure and 5% dynamic failure.

关 键 词：存储器内建自测试 步进算法 诊断数据压缩 故障模式识别 动态故障 

分 类 号：TP333[自动化与计算机技术—计算机系统结构] TN402[自动化与计算机技术—计算机科学与技术]