Automated electron temperature fitting of Langmuir probeⅠ-Ⅴtrace in plasmas with multiple Maxwellian EEDFs  

作　　者：Chi-Shung YIP Wei ZHANG Guosheng XU Noah HERSHKOWITZ 叶孜崇;张炜;徐国盛;Noah HERSHKOWITZ(Institute of Plasma Physics,Chinese Academy of Sciences,Hefei 230031,People's Republic of China;Department of Engineering Physics,University of Wisconsin—Madison,Madison,WI 53706,United States of America)

机构地区：[1]Institute of Plasma Physics,Chinese Academy of Sciences,Hefei 230031,People's Republic of China [2]Department of Engineering Physics,University of Wisconsin—Madison,Madison,WI 53706,United States of America

出　　处：《Plasma Science and Technology》2020年第8期109-119,共11页等离子体科学和技术（英文版）

基　　金：This work is supported by the Chinese Academy of Science Hundred Youth Talent Program Start-up Funding,CAS Key Research Program of Frontier Sciences(No.QYZDB-SSW-SLH001);National Natural Science Foundation of China(Nos.11875285,11575248 and 11505220);well as US National Science Foundation Award(No.1804654).

摘　　要：An algorithm for automated fitting of the effective electron temperature from a planar Langmuir probe I-V trace taken in a plasma with multiple Maxwellian electron populations is developed through MATLAB coding.The code automatically finds a fitting range suitable for analyzing the temperatures of each of the electron populations.The algorithm is used to analyzeⅠ-Ⅴtraces from both the Institute of Plasma Physics Chinese Academy of Sciences's Diagnostic Test Source device and a similar multi-dipole chamber at the University of Wisconsin-Madison.Ⅰ-Ⅴtraces reconstructed from the parameters fitted by the algorithm not only agree with the measured I-V trace but also reveal physical properties consistent with those found in previous studies.Cylindrical probe traces are also analyzed with the algorithm and it is shown that the major source of error in such attempts is the disruption of the inflection point due to both decreased signal-to-noise ratio and greater sheath expansion.It is thus recommended to use planar probes with radii much greater than the plasma Debye length when signal-to-noise ratio is poor.

关 键 词：EEDF LANGMUIR probes plasma DIAGNOSTICS 

分 类 号：O53[理学—等离子体物理]