微系统产品宇航应用可靠性保证关键技术  

The Key Technologies of Reliability Assurance for Microsystem Products in Space Applications

作　　者：朱恒静[1] 张延伟[1] 张伟[1] 祝名 ZHU Hengjing;ZHANG Yanwei;ZHANG Wei;ZHU Ming(China Aerospace Components Engineering Center,Beijing 100094,China)

机构地区：[1]中国航天宇航元器件工程中心,北京100094

出　　处：《电子产品可靠性与环境试验》2020年第5期7-10,共4页Electronic Product Reliability and Environmental Testing

摘　　要：对国内外微系统产品技术的发展趋势和微系统产品宇航应用需求进行了分析,结合微系统产品的结构和工艺特点,提出了针对系统设计评价、特性表征、研制过程保证、抗辐射保证和测试验证等方面开展微系统产品可靠性保证的方法,并对保证过程中的关键技术进行了详细的阐述。The development trend of microsystem product technology and the demand for aerospace applications of microsystem products both at home and abroad are analyzed.Combining with the structure and process characteristics of microsytem product,a method to carry out microsystem product reliability assurance for system design evaluation,characterization,development process assurance,radiation resistance assurance,radiation resistance assurance,and test verification is proposed,and the key technologies in the guarantee process are explained in detail.

关 键 词：微系统 发展现状 可靠性保证 关键技术 

分 类 号：TB114.3[理学—概率论与数理统计]