基于可测试性技术的测试矩阵优化研究  

Research on test matrix optimization based on testability technology

作　　者：王力[1] 贾春宇 WANG Li;JIA Chunyu(Vocational and Technical School,Civil Aviation University of China,Tianjin 300300,China;College of Electronic Information and Automation,Civil Aviation University of China,Tianjin 300300,China)

机构地区：[1]中国民航大学职业技术学院,天津300300 [2]中国民航大学电子信息与自动化学院,天津300300

出　　处：《现代电子技术》2020年第21期137-142,共6页Modern Electronics Technique

基　　金：国家自然科学基金项目(U1733119);国家自然科学基金项目(U1333111);中央高校基本科研业务费项目(3122017018)。

摘　　要：可测试性技术在机载电路板中的应用使故障诊断问题得到快速发展,但是测试时间长,测试成本高。为了缩短测试时间,降低测试成本,基于MCSA算法、等权值抗误判算法、极小权值-极大相异性算法,融合改进的测试矩阵优化算法,使测试矩阵更加优化,测试向量数量减少。经实验验证,运用优化后的测试矩阵进行测试可以有效缩短测试时间,提高测试效率,降低测试成本。The application of testability technology in onboard circuit boards makes the fault diagnosis develop rapidly,but the test time is long and the test cost is high.In order to shorten the test time and reduce the test cost,the improved test matrix optimization algorithm is integrated on the basis of the modified counting sequence algorithm(MCSA),the equal weight anti⁃misjudgment algorithm and the minimum weight⁃maximum dissimilarity algorithm to make the test matrix more optimized and the number of test vectors reduced.It has been verified in experiments that the optimized test matrix can effectively shorten the test time,improve the test efficiency and reduce the test cost.

关 键 词：可测试性技术 故障诊断 机载电路板 测试时间 测试成本 测试矩阵 

分 类 号：TN407-34[电子电信—微电子学与固体电子学] TP301.6[自动化与计算机技术—计算机系统结构]