基于性能退化数据的固态微波功率器件加速寿命试验  

Accelerated Life Test about Solid State Microwave Power Device Based on Data of Performance Degradation

作　　者：王文娟[1] 柳华光 邢荣欣[1] 王耀国 Wang Wen-juan;Liu Hua-guang;Xing Rong-xin;Wang Yao-guo(China Electronic Standardization Institute,Beijing 100176;The 13th Research Institute Of China Electronics Technology Group Corporation,Hebei Shijiazhuang 050200)

机构地区：[1]中国电子技术标准化研究院,北京100176 [2]中国电子科技集团公司第十三研究所,河北石家庄050200

出　　处：《电子质量》2020年第10期53-57,共5页Electronics Quality

摘　　要：该文针对固态微波功率器件的实际工作条件,选择Ga N固态微波功率器件,开展直流稳态加速寿命试验和射频动态加速寿命试验,通过二者试验数据,分析器件的退化趋势,并得出器件的失效率,对固态微波功率器件的寿命可靠性研究提供参考。Aiming at the actual working conditions of solid-state microwave power device,the paper selected GaN solid-state microwave power device,and conducted RF dynamic and DC steady-state accelerated life test.Acourding to the test data,the paper analysed the trends of device degradation,and got the failure rate,which can provide the reference to the life of solid-state microwave power device reliability research.

关 键 词：微波功率器件 加速寿命试验 性能退化 

分 类 号：TN307[电子电信—物理电子学] TN62