一种用于数字电路单粒子效应试验的系统设计  

A System Design Utilized in Single Event Effect Experiment of Digital Circuits

作　　者：陈嘉鹏 何威 王威 CHEN Jiapeng;HE Wei;WANG Wei(China Key System&Integrated Circuit Co.,Ltd.,Wuxi 214072,China)

机构地区：[1]中科芯集成电路有限公司,江苏无锡214072

出　　处：《电子与封装》2020年第11期51-55,共5页Electronics & Packaging

摘　　要：单粒子效应试验是地面评估元器件抗辐射性能的有效方法。随着航天事业的高速发展,宇航元器件需求逐年增大,对其辐射性能评价的单粒子试验越来越频繁。提出一种通用型单粒子效应试验系统,可满足大部分数字电路的单粒子试验评价需求。从系统架构、硬件设计及软件设计几个方面对单粒子效应试验系统的设计方法进行介绍。基于该系统可以方便地进行不同型号数字电路的单粒子效应试验系统开发,缩短系统开发周期,提升效率。Single event effect experiment is an effective method to make ground-level evaluation for the radio resistance performance of components.With the rapid development of aerospace industry,requirement of space components is increasing year by year.The single event experiment for their performance becomes more and more frequent.This article proposed a general type experiment system for single event effect,which could satisfy the assessment demands for most of the digital circuits.The design approach for this test system is introduced from several aspects like system architecture,hardware design and software design.Depending on this system,it will be convenient to develop single event effect experiment system according to different type of digital circuits.The development period is shortened and the efficiency is improved.

关 键 词：单粒子效应试验 通用型 数字电路 

分 类 号：TN402[电子电信—微电子学与固体电子学]