基于结构光检测的三维轮廓测量专利技术综述  

Summary of Patent Technology for Profile 3D Measurement Based on Structured Light

作　　者：田翠萍 饶红 TIAN Cuiping;RAO Hong(Patent Examination Cooperation Sichuan Center of the Patent Office,CNIPA,Chengdu 610213)

机构地区：[1]国家知识产权局专利局专利审查协作四川中心,成都610213

出　　处：《中国发明与专利》2020年第S02期72-77,共6页China Invention & Patent

摘　　要：结构光三维轮廓测量技术是一种基于主动视觉的非接触三维测量方法,近年来成为几何测量领域的一个热点。本文基于CNABS和DWPI数据库,通过检索、筛选、统计和分析国内外与结构光三维轮廓测量相关的发明和实用新型专利,重点研究了点结构光法、线结构光法、面结构光法的技术发展路线,并对其未来发展趋势进行了展望。Structured light 3D measurement technology is a non-contact 3D measurement method based on active vision,which has become a hot spot in the area of geometric measurement in recent years.This paper introduces the patent application of point structure light method,line structure method and surface structure light method through the retrieval,statistics and analysis of domestic and foreign patents based on CNABS and DWPI databases,and prospect the future of 3D measurement technology.

关 键 词：专利 结构光 三维测量 轮廓 

分 类 号：G306[文化科学]