提高老炼试验板可靠性的设计方法实例分析  

Example Analysis of Design Method for Improving Reliability of Aging Test Board PCB

作　　者：陈真[1] 冯慧玲 成锡军 Chen Zhen;Feng Hui-ling;Cheng Xi-jun(China Electronics Technology Group Corporation No.58 Research Institute,Jiangsu Wuxi 214035)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214035

出　　处：《电子质量》2020年第12期46-51,共6页Electronics Quality

摘　　要：老炼试验板(PCB)是电子产品老炼过程中电路元件和器件的支撑件,为电路元件和器件之间提供电气连接。通过对典型案例的异常问题进行分析,提出了提高PCB可靠性设计的改善方法和完善措施,从影响PCB设计的"布通率"和抗干扰性方面,针对布局、布线、电源/地的处理、数/模电路的共地处理等因素进行改进,显著提高了老炼试验板的可靠性。Aging Test Board PCB is the support of circuit components and devices in the process of sophistication of electronic products,providing electrical connections between circuit components and devices.Based on the analysis of the abnormal problems in typical cases,The improvement methods and measures to improve the reliability design of PCB are put forward.From the aspects of affecting the PCB design's pass-through rate and anti-interference,the reliability of the aging test board is significantly improved in terms of layout,wiring,power/ground treatment,common ground treatment of digital-analog circuit and other factors.

关 键 词：PCB 可靠性设计 PCB板优化 

分 类 号：TN406[电子电信—微电子学与固体电子学]