低噪声CMOS图像传感器技术研究综述  

An Overview of Low Noise CMOS Image Sensor Technique

作　　者：刘嵘侃[1,2] 邢德智 唐昭焕 徐炀 LIU Rongkan;XING Dezhi;TANG Zhaohuan;XU Yang(Chongqing Acoustic-Optic-Electronic Co.Ltd.,Chongqing 400060,CHN;United Microelectronics Center Corp.,Chongqing 401332,CHN;Science and Technology on Analog Integrated Circuit Laboratory,Chongqing 400060,CHN)

机构地区：[1]中国电子科技集团重庆声光电有限公司,重庆400060 [2]联合微电子中心有限责任公司,重庆401332 [3]模拟集成电路重点实验室,重庆400060

出　　处：《半导体光电》2020年第6期768-773,共6页Semiconductor Optoelectronics

摘　　要：文章总结了低噪声CMOS图像传感器代表性关键技术的最新研究进展。从CMOS图像传感器架构及各模块设计的角度,介绍了有源像素结构和图像传感器架构,分析了广泛采用的像素内源跟随CMOS图像传感器读出电路及其噪声等效模型,重点介绍了低噪声CMOS图像传感器关键技术,包括共享参考像素差分共源放大器技术、相关多采样技术、像素内斩波技术,以及相关技术的电路级实现方式。The latest developments of representative key technologies of low noise CMOS image sensors are summarized.The active pixel structure and the readout circuit architecture of image sensor are introduced from such aspects as the architectures and module design of CMOS image sensors.The readout circuit with in-pixel source follower and its noise equivalent model are analyzed.The key technologies of low noise CMOS image sensor are introduced in detail,including reference-shared in-pixel differential amplifier technique,correlated multiple sampling technique and in-pixel chopping technique,and the circuit implementations of these techniques are introduced as well.

关 键 词：CMOS图像传感器 低噪声 相关多采样 模拟集成电路 

分 类 号：TN432[电子电信—微电子学与固体电子学]