基于光学干涉法的翻新电子元器件鉴别方法  

Identification Method of Refurbished Electronic Components Based on Optical Interferometry

作　　者：温景超 吴立强[1] 赵彦飞[1] 于望 WEN Jingchao;WU Liqiang;ZHAO Yanfei;YU Wang(China Academy of Launch Vehicle Technology,Beijing 100076,CHN)

机构地区：[1]中国运载火箭技术研究院,北京100076

出　　处：《半导体光电》2020年第6期822-826,共5页Semiconductor Optoelectronics

摘　　要：翻新电子元器件存在重大质量隐患,对航天装备的质量和安全构成了严重威胁。为了确保装机电子元器件的质量和可靠性,结合翻新元器件的特点,提出了一种鉴别翻新元器件的无损检测方法。首先,阐述了翻新元器件的检测方法和原理,即通过光学干涉法定量测量器件上下表面的粗糙度,并根据二者之间的差异来判断器件表面是否经过翻新处理。然后,采用该方法对正常元器件和翻新元器件的表面粗糙度差异进行对比检测分析,并进行不确定度评定。结果表明,该方法可用于对翻新元器件进行高效准确鉴别。这为全面提升航天电子元器件的质量提供了新的检测手段。Refurbished electronic components present serious potential quality problems,which will pose serious threats to the quality and safety of space equipments.In order to ensure the quality and reliability of installed electronic components,a nondestructive measurement method is proposed for identifying refurbished components based on their characteristics.Firstly,the measurement methods and principles are described:the roughness of both the top and the bottom surfaces of the device is measured quantitatively by optical interferometry,and then the difference between the two roughness values will be used to judge whether the surface of the device was refurbished or not.Lastly,the surface roughness of the normal and refurbished components is compared and analyzed,and the uncertainty evaluation is carried out.It is shown that this method can be used to identify refurbished components efficiently and accurately.It provides a new measurement method for improving the quality of aerospace electronic components.

关 键 词：翻新元器件 鉴别方法 表面粗糙度 光学干涉法 无损检测 

分 类 号：TN306[电子电信—物理电子学]