面向多位扫描单元的可诊断性设计方法  

Diagnosability Design Method for Multi-bit Scan Cells

作　　者：国欣祯 井鹏飞 叶靖[2,4] 黄正峰 李晓维[2,4] 李华伟[2,4] GUO Xinzhen;JING Pengfei;YE Jing;HUANG Zhengfeng;LI Xiaowei;LI Huawei(School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230601, China;State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100190, China;School of Artificial Intelligence, University of Chinese Academy of Sciences, Beijing 100190, China;University of Chinese Academy of Sciences, Beijing 100190, China)

机构地区：[1]合肥工业大学电子科学与应用物理学院,安徽合肥230601 [2]中国科学院计算技术研究所计算机体系结构国家重点实验室,北京100190 [3]中国科学院大学人工智能学院,北京100190 [4]中国科学院大学,北京100190

出　　处：《郑州大学学报（理学版）》2021年第1期80-87,共8页Journal of Zhengzhou University:Natural Science Edition

基　　金：国家自然科学基金项目(61704174,61532017,61432017,61521092)。

摘　　要：提出了面向多位扫描单元的扫描链重连可诊断性设计方法,在满足多位扫描单元约束与后端设计限制的情况下,利用启发式算法实现了扫描单元分配优化。在ISCAS′89基准电路的实验结果表明,采用所提方法对含有多位扫描单元的电路进行优化后,b17电路SA-0和SA-1故障的平均诊断分辨率分别为优化前的12.59倍和13.37倍;s38417电路SA-0和SA-1故障的平均诊断分辨率分别为优化前的19.95倍和3.04倍。A scan chain reconnection diagnostic design approach for multi-bit scan cells was proposed.On the condition that the constraints of multi-bit scan cells and the limitations of back-end design were fulfilled,heuristic algorithms were used to optimize the allocation of scan cells.The results of experiments using the ISCAS′89 benchmark circuit showed that after the proposed method was used to optimize the circuit containing the multi-bit scan cells,the average diagnostic resolution of SA-0 and SA-1 faults of the b17 circuit was increased by 12.59 times and 13.37 times respectively;the average diagnostic resolution of the SA-0 and SA-1 faults of the s38417 circuit was increased by 19.95 times and 3.04 times respectively.

关 键 词：多位扫描单元 故障诊断 敏感单元 

分 类 号：TN407[电子电信—微电子学与固体电子学]