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作 者:李强[1] 金龙旭[1] 李国宁[1] LI Qiang;JIN Long-xu;LI Guo-ning(Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033,China)
机构地区:[1]中国科学院长春光学精密机械与物理研究所,吉林长春130033
出 处:《液晶与显示》2021年第2期327-333,共7页Chinese Journal of Liquid Crystals and Displays
基 金:国家重点研发计划(No.2017YFB0404800)。
摘 要:为了抑制由读出放大电路增益不一致导致的CMOS传感器固定模式噪声(FPN),提高成像质量,本文提出了基于暗电流的固定模式噪声校正方法。该方法相比于传统校正方法具有校正系统简单,算法易于实现的优点。本文对校正前后的图像通过灰度方差进行评估,评估结果表明由暗电流形成的本底图像,图像灰度方差校正后相比于校正前,降低1~2个数量级;均匀光照条件下的CMOS图像,校正后相比于校正前,图像灰度方差增大2个数量级。该评估结果及相关结论对暗电流本底图像及相关校正方法探讨具有一定的借鉴意义。In order to restrain the effect of CMOS image sensor fixed pattern noise(FPN)caused by the gain mismatch of readout amplifier circuit,to improve the quality of imaging,a method of fixed pattern noise correction based on the dark current is proposed in this paper.Compared with the traditional correction methods,this method has simple correction system,and the algorithm is easy to be implemented.The images before and after correction were evaluated via the grayscale variance,and the evaluation results show that in the background image formed by dark current,the grayscale variance of after corrected image reduced by 4 orders of magnitude compared with that before correction.As for the CMOS image under uniform illumination condition,the grayscale variance of after corrected image increased by 2 orders of magnitude compared with that before correction.The evaluation results and related conclusions are useful for the future study of dark current background images and correlation correction methods.
关 键 词:暗电流 CMOS图像传感器 本底图像 固定模式噪声
分 类 号:TN492[电子电信—微电子学与固体电子学]
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