利用光学干涉法测量液体薄膜特性  

Liquid thin films measurement based on optical interference

作　　者：官子涵 潘玉寨[1] GUAN Zi-han;PAN Yu-zhai(Department of Optoelectronic Science, Harbin Institute of Technology at Weihai, Weihai 264209, China)

机构地区：[1]哈尔滨工业大学(威海)光电科学系,山东威海264209

出　　处：《物理实验》2021年第2期27-32,共6页Physics Experimentation

基　　金：山东省教学创新计划项目(No.SDYC16002);哈工大教改项目(No.JGYJ-2019039)。

摘　　要：将光学干涉的原理与色度学方法相结合,通过计算机编程实现由颜色的色调值到光程差的转换,实现白光干涉图的计算机模拟,通过查表比色法还原薄膜厚度信息.测试了该方法用于理想薄膜和实际液体薄膜的厚度分布信息,效果良好.该实验可在实验室内完成,也可居家完成,可用于光电信息相关专业实验项目和课程内容的扩展.The principle of optical interference was combined with colorimetric method to realize the conversion from the hue value of color to the optical path difference by computer programming and simulation of white light interferogram.By this method,the film thickness information of idea thin film and actual liquid film were restored.The experiment could be completed in the laboratory or at home and could be used to expand the experimental projects and course contents of photoelectric information related majors.

关 键 词：白光干涉 液体薄膜 还原比色法 图像处理 

分 类 号：O436.1[机械工程—光学工程]