基于CFD技术的薄膜热电偶热阻修正模型研究  

Research on Thermal Resistance Correction Model of Thin Film Thermocouple Based on CFD Technology

作　　者：王玉芳[1] 董素艳 常蕾[1] WANG Yufang;DONG Suyan;CHANG Lei(Changeheng Institute of Metrology&Measurement,Bejjing 100095,China;Northwest Universrty of Technology,Xi'an 710072,China)

机构地区：[1]航空工业北京长城计量测试技术研究所,北京100095 [2]西业工业大学,陕西西安710072

出　　处：《计测技术》2021年第1期22-26,共5页Metrology & Measurement Technology

基　　金：航空“十三五”技术基础项目(HK30420171JL01)。

摘　　要：针对薄膜热电偶表面温度测量问题,以选定的薄膜热电偶模型为研究对象,开展不同表面温度下胶层厚度引入的测量误差的CFD数值仿真和试验研究,得到表面温度、胶层厚度与热阻修正之间的对应关系,在此基础上建立热阻修正模型,并设计试验进行验证,结果表明:在相同胶层厚度下,测温偏差大小随着表面温度与环境温度差值增大而增大,与试验结果一致;在相同表面温度下,胶层厚度越薄,测温偏差越小,与实际情况相符。Aiming at the field calibration problem of using thin-film thermocouple to measure the surface temperature,the CFD numerical simulation and experimental research on the measurement error caused by the thickness of adhesive layer under different surface temperatures are carried out.The corresponding relationship between the surface temperature,adhesive layer thickness and thermal resistance correction is obtained.On this basis,the thermal resistance correction model is established,and experiments are designed to verify it.The results show that under the same adhesive layer thickness,the temperature measurement deviation increases with the increase of the difference between the surface temperature and the ambient temperature,which is consistent with the experimental results,and under the same surface temperature,the thinner the adhesive layer thickness,the smaller the temperature measurement deviation,which is also consistent with the actual situation.

关 键 词：薄膜热电偶 热阻修正 CFD数值仿真 表面温度测量 

分 类 号：TB9[一般工业技术—计量学] V231.1[机械工程—测试计量技术及仪器]