STM32单片机在新型电容测量中的应用  

Implementation of New Capacitance Measurement Based on STM32

作　　者：张昌胜 宋建萍 郑业爽 蒋小辉 ZHANG Changsheng;SONG Jianping;ZHENG Yeshuang;JIANG Xiaohui(Department of Mechanical and Electrical,College of Science and Technology of China Three Gorges University,Hubei 443002,China)

机构地区：[1]三峡大学科技学院机械电气学部,湖北443002

出　　处：《集成电路应用》2021年第2期16-17,共2页Application of IC

摘　　要：基于一阶R-C电路,根据电路动态性能测量电容C大小,较传统的测量方法其自动化水平及精度都有一定提升。采用上-下位机模式,在下位机中对R-C电路动态性能分析,获得电容测量值并上传至上位机,上位机对数据进行处理及误差分析,并自动生成数据文件保存。该测量仪经实践验证,操作简单、精度高、快速高效且扩展性及应用性较强。This paper is to measure the resistance of the capacitance,based on the transient analysis on first-order R-C circuit.The automation level and accuracy are improved,compared with the traditional measurement method.In this paper,transient analysis on first-order R-C circuit and measuring the resistance of the capacitance are accomplished by the slave computer.By the host computer,the error analysis is complete,and the data,from the slave computer,is processed and saved.The measuring instrument was featured with easy operation,accuracy measurement,strong expandability and applicability and high efficiency,according to the practice.

关 键 词：R-C电路 动态性能 电容测量 

分 类 号：TP212[自动化与计算机技术—检测技术与自动化装置] TP368.12[自动化与计算机技术—控制科学与工程]