基于V50的传输延时参数的测试方法  

The Method of Testing Propagation Delay Parameter on the V50

作　　者：彭梦林 徐玉鑫 刘敏 PENG Menglin;XU Yuxin;LIU Min(I-Core Electronics Co.,Wuxi 214072,China)

机构地区：[1]无锡中微爱芯电子有限公司,江苏无锡214072

出　　处：《电子与封装》2021年第4期28-31,共4页Electronics & Packaging

摘　　要：随着集成电路的高速发展,使用者对电路的性能要求也越来越高。以传统的应用评估的方式来获取电路的传输延时参数的方法,可评估的电路数量非常受限,在高低温条件下也不便于测试。利用测试机测试传输延时,也只是通过运行测试码、设定门限来判定此项参数是否满足要求,无法获取其具体数值。针对传统的测试缺陷,提出一种利用V50(一种数模混合测试机)测量其传输延时的方法。介绍其软硬件准备、具体操作方法、测试注意点等,提供了一种可测、可数据化、可量产的解决方案。With the rapid development of integrated circuits,users have higher and higher requirements for circuit performance.The traditional method of evaluation to obtain the AC parameters of circuits is very limited in the number of circuits that can be evaluated and is not convenient for testing at high and low temperature.When the test machine is used to test the circuit propagation delay parameter,it only judges whether the parameter meets the requirement by running the test code and setting the threshold.Aiming at the traditional test defects,this paper presents a method to measure the propagation delay parameters by using V50(an digital-analog hybrid testing machine),introduces the preparation of software and hardware,specific operation methods,test points,etc.,and provides a measurable,data-ready and mass-produced solution.

关 键 词：测试机 传输延时 可数据化 可量产 

分 类 号：TN407[电子电信—微电子学与固体电子学]