基于FPGA的存储内建自测试的研究  

Research on Built-In Self-Test of Memory Based on FPGA

作　　者：薛凯 侯荣彬 李勇[1] Xue Kai;Hou Rongbin;Li Yong(Science and Technology on Reactor System Design Technology Laboratory Nuclear Power Institute of China,Chengdu,610213,China)

机构地区：[1]中国核动力研究设计院核反应堆系统设计技术重点实验室,成都610213

出　　处：《仪器仪表用户》2021年第6期53-57,共5页Instrumentation

摘　　要：本文以SRAM为研究对象,介绍了储存器中常见的几种故障类型以及测试方法。March算法能够对各种储存器常见故障进行检测,但有些故障(比如耦合故障中的字内故障和字间故障)是检测不出来的。通过对现有测试算法的优化,使储存器测试的故障覆盖率更高,并采用硬件描述语言,以FPGA为开发平台,以储存器内建自测试(Memory Build-In Self-Test,MBIST)的方式构建SRAM测试电路,并进行仿真验证。This paper takes SRAM as the research object,and introduces several common fault types and test methods about memory.March algorithm can detect all kinds of common faults of memory,but some faults(such as intra-word fault and interword fault in coupling fault)can not be detected.By optimize the existed test algorithms,the fault coverage of memory test is higher,adopt the hardware description language and FPGA platform.Take the way of Memory Build-In Self-Test(MBIST)to build the SRAM test circuit,finally verified by simulation.

关 键 词：硬件描述语言 MARCH SRAM MBIST FPGA 

分 类 号：TP273[自动化与计算机技术—检测技术与自动化装置]