High-fidelity structured illumination microscopy by point-spread-function engineering  被引量:22

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作  者:Gang Wen Simin Li Unbo Wang Xiaohu Chen Zhenglong Sun Yong Liang Xin Jin Yifan Xing Yaming jiu Yuguo Tang Hui Li 

机构地区:[1]Jiangsu Key Laboratory of Medical Optics,CAS Center for Excellence in Molecular Cell Science,Suzhou Institute of Biomedical Engineering and Technology,Chinese Academy of Sciences,Suzhou,Jiangsu 215163,China [2]Academy for Engineering and Technology,Fudan University,Shanghai 200433,China [3]The Center for Microbes,Development and Health,Key Laboratory of Molecular Virology and Immunology,Institute Pasteur of Shanghai,Chinese Academy of Sciences,Shanghai 200031,China

出  处:《Light(Science & Applications)》2021年第5期812-823,共12页光(科学与应用)(英文版)

基  金:The work was supported by the National Key Research and Development Program of China[grant no.2017YFC0110100];the National Natural Science Foundation of China[grant no.61805272].

摘  要:Structured illumination microscopy(SIM)has become a widely used tool for insight into biomedical challenges due to its rapid,long-term,and super-resolution(SR)imaging.However,artifacts that often appear in SIM images have long brought into question its fidelity,and might cause misinterpretation of biological structures.We present HiFi-SIM,a high-fidelity SIM reconstruction algorithm,by engineering the effective point spread function(PSF)into an ideal form.HiFi-SIM can effectively reduce commonly seen artifacts without loss of fine structures and improve the axial sectioning for samples with strong background.In particular,HiFi-SIM is not sensitive to the commonly used PSF and reconstruction parameters;hence,it lowers the requirements for dedicated PSF calibration and complicated parameter adjustment,thus promoting SIM as a daily imaging tool.

关 键 词:HIFI ILLUMINATION FUNCTION 

分 类 号:TH742[机械工程—光学工程]

 

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