Ellipsometric determination of permittivity in a negative index photonic crystal metamaterial  

作　　者：Principia Dardano Massimo Gagliardi Ivo Rendina Stefano Cabrini Vito Mocella 

机构地区：[1]Institute for microelectronics and microsystems,National Council of Research,Department of Naples,Naples 80131,Italy [2]Molecular Foundry,Lawrence Berkeley National Laboratory,Berkeley,CA,USA

出　　处：《Light(Science & Applications)》2012年第1期1-5,共5页光（科学与应用)（英文版）

基　　金：Portions of this work were completed as part of a user project at the Molecular Foundry,Lawrence Berkeley National Laboratory,which is supported by the US Department of Energy under contract DE-AC02-05CH11231;We gratefully acknowledge Aleksandr Polyakov for his suggestions in critically revising the manuscript.This work was partially supported by Italian National Operative Programs PON01_02782,PON01_01525 and PON01_00375.

摘　　要：In this work,we present the first experimental evidence of negative dielectric susceptibility in a two-dimensional silicon photonic crystal(PhC)with negative refractive index behavior.In the frequency range in which the effective refractive index neff is equal to 21,the incident light couples efficiently to the guided modes in the top surface layer of the PhC metamaterial.These modes resemble surface plasmon polariton resonances.This finding was confirmed by ellipsometric measurements,demonstrating the isotropy of the PhC resonances.Such negative index PhC materials may be of use in biosensing applications.

关 键 词：diffraction gratings METAMATERIALS photonic crystals 

分 类 号：R73[医药卫生—肿瘤]