静态随机存储器在轨自检算法  

Algorithm of in-orbit SRAM for self-inspection

作　　者：吴洋 王羿 于新宇 许智龙 任放[3] 黄缙[3] WU Yang;WANG Yi;YU Xinyu;XU Zhilong;REN Fang;HUANG Jin(University of Science and Technology of China,Hefei 230026,China;Anhui Institute of Optics and Fine Mechanics,Chinese Academy of Sciences,Hefei 230031,China;Beijing Institute of Spacecraft System Engineering,Beijing 100094,China)

机构地区：[1]中国科学技术大学,合肥230026 [2]中国科学院安徽光学精密机械研究所,合肥230031 [3]北京空间飞行器总体设计部,北京100094

出　　处：《北京航空航天大学学报》2021年第6期1233-1240,共8页Journal of Beijing University of Aeronautics and Astronautics

基　　金：王宽诚教育基金“先进偏振遥感技术与应用国际团队”(GJTD-2018-15)。

摘　　要：静态随机存储器(SRAM)在轨自检应用于星载电子设备上电初始化过程中,能够在电子设备开始工作前发现存储器的故障单元,为评估电子设备健康状态提供依据。分析了SRAM的结构和常见的故障原理,针对在轨应用这一特殊背景开展研究,提出了对典型测试算法的改进方案。在完成对改进方案的分析和评价后,以8 K×8 bit存储器为例开展算法的实现,并验证了改进方案的可行性。与典型测试算法相比,所提改进方案具有资源开销少、故障覆盖率高等优点。In-orbit self-inspection of Static Random Access Memory(SRAM) in spaceborne electronic equipment is used in the power-on initialization process. It is able to find the faulty unit of the memory before equipment starts to work. It provides a basis for evaluating the health status of electronic equipment. The structure and main failure principle of SRAM were analyzed, and the research in the special background of in-orbit application was conducted. Then, an improved test algorithm for the typical one was proposed. After the analysis and evaluation of the improved algorithm, the implementation of the algorithm on a 8 K×8 bit SRAM was carried out. Experimental results show that the improved algorithm is feasible. Compared with typical test algorithm, the improved algorithm has the advantages of low resource consumption and high fault coverage.

关 键 词：静态随机存储器(SRAM) 在轨自检 MARCH算法 集成电路测试 航天产品 

分 类 号：TP301.6[自动化与计算机技术—计算机系统结构]