面元像素CdZnTe辐射探测器成像系统的设计  

Design of Imaging System for Bin Pixel CdZnTe Radiation Detector

作　　者：沈敏[1] SHEN Min(Chongqing Technology and Business Institute,Chongqing 400052,China)

机构地区：[1]重庆工商职业学院,重庆400052

出　　处：《现代信息科技》2021年第11期27-30,共4页Modern Information Technology

基　　金：重庆市教育委员会课题(KJQN 202004006)。

摘　　要：该文从面元像素CdZnTe探测器的基本原理出发,以成像探测为目的建立了CdZnTe成像探测系统,相应地对其性能参数进行了分析研究。此外,还根据针孔成像的原理引入了针孔成像系统。实验结果表明,所搭建的面元像素CdZnTe探测器具有良好的成像探测性能,而对于所引入的针孔成像系统,则应根据时间和目的的要求选取不同的尺寸,以确保成像质量。Based on the basic principle of bin pixel CdZnTe detector,a CdZnTe imaging detection system is established for the purpose of imaging detection,and its performance parameters are analyzed and studied accordingly.In addition,pinhole imaging system is introduced according to the principle of pinhole imaging.The experimental result shows that the built bin pixel CdZnTe detector has good imaging detection performance.For the introduced pinhole imaging system,different sizes should be selected according to the requirements of time and purpose to ensure the imaging quality.

关 键 词：面元像素探测器 成像系统 针孔系统 

分 类 号：TL814[核科学技术—核技术及应用]