微波等离子体原子发射光谱分析粗粮中的多元素  

Multi-element Analysis of in Coarse Grains Using Microwave Plasma Atomic Emission Spectrometry

作　　者：周学忠 刘宏伟 Zhou Xuezhong;Liu Hongwei(College of Material and Chemical Engineering,Hunan Institute of Technology,Hengyang 421002)

机构地区：[1]湖南工学院材料与化学工程学院,衡阳421002

出　　处：《中国粮油学报》2021年第10期154-158,共5页Journal of the Chinese Cereals and Oils Association

基　　金：国家自然科学基金项目(81603400);湖南省自然科学基金项目(2019JJ60026);湖南省应用特色学科材料科学与工程学科(湘教通[2018]469号);湖南省工程研究中心(湘发改委高技[2019]853号)。

摘　　要：基于微波等离子体原子发射光谱(MP-AES)建立了测定粗粮类食品中多元素K、Na、Ca、Mg、Fe、Cu、Zn、Mn的分析方法。对于在低温等离子体MP的激发下不能完全电离的分析元素,选择原子谱线替代离子谱线为分析波长提高了分析灵敏度,利用快速线性干扰校正(FLIC)技术校正光谱干扰和背景干扰,采用内标元素Y校正基体效应,实现了无干扰测定所有分析元素,通过测定标准参考物质米粉(SRM 1566a)对分析方法的准确性和精密度进行了评价。结果显示,所有元素的线性关系良好(线性相关系数≥0.9996),方法检出限(MDL)为0.02~0.38μg/g。MP-AES为粗粮类食品的多元素分析提供了低成本解决方案,具有良好的准确性和长期稳定性,降低了运行成本,提高了实验室安全性。An analytical method for the determination of multi-element K,Na,Ca,Mg,Fe,Cu,Zn,and Mn in coarse grains based on microwave plasma atomic emission spectrometry(MP-AES)was established.For the analyte that cannot be completely ionized under the excitation of low-temperature plasma MP,the atomic line was selected to replace the ion line as the analysis wavelength to improve the analytical sensitivity.Fast linear interference correction(FLIC)technology was used to correct spectral interference and background interference,and Y was used as the internal standard element to correct the matrix effect to achieve interference-free determination of analytes.The accuracy and accuracy of the method were evaluated using the standard reference material rice flour(SRM 1566a).The results showed that the linear relationship of analyte was good(linear correlation coefficient≥0.9996),and method detection limits(MDLs)were 0.02~0.38μg/g.MP-AES provides a low-cost solution for multi-elemen t analysis of coarse grains,with excellent accuracy and long-term stability,reduced running costs,and improved lab safety.

关 键 词：粗粮 微波等离子体原子发射光谱 多元素 快速线性干扰校正 基体效应 

分 类 号：O657.3[理学—分析化学]