红外探测器集成光学系统低温评价方法研究  

Low Temperature Evaluation Method of Infrared DetectorIntegrated with Optical System

作　　者：张璐 张磊[1] 付志凯 田亚 ZHANG Lu;ZHANG Lei;FU Zhikai;TIAN Ya(North China Institute of Optoelectronic Technology,Beijing 100015,China)

机构地区：[1]华北光电技术研究所,北京100015

出　　处：《红外技术》2021年第12期1188-1192,共5页Infrared Technology

摘　　要：红外探测器集成光学技术是将部分成像光学系统集成在杜瓦结构内部,以保证F数较小、探测目标信号能量大的同时,消除光学系统体积庞大和复杂带来的不便因素。本文研究的红外探测器集成光学低温评价技术是在不反复拆除杜瓦的前提下,直接评估集成光学系统低温MTF,缩短测试周期。进行集成光学透镜组精密装配,在此基础上开发独立的集成光学系统低温MTF评价装置,并搭建MTF测试光路,获得集成光学透镜组温度分布梯度,为集成光学透镜组的装配精度和光学性能提供可靠数据。To test the low temperature MTF of infrared detectors integrated with an optical system inside a Dewar,a shell structure Dewar was designed.The inconvenient factors caused by the large size and complexity of the optical system is eliminated.The MTF test optical path was built to obtain the temperature distribution gradient of the integrated optical lens group,providing reliable data for the assembly accuracy and optical performance of the integrated optical lens group.

关 键 词：集成光学 光学透镜组 低温MTF测试 

分 类 号：TN216[电子电信—物理电子学]